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1

A detailed analysis of the optical beam deflection technique for use in atomic force microscopy

Putman, Constant A. J., De Grooth, Bart G., Van Hulst, Niek F., Greve, Jan

Journal:

Journal of Applied Physics

Year:

1992

Language:

english

File:

PDF, 1.09 MB

english, 1992

2

SPIE Proceedings [SPIE Laser Spectroscopy of Biomolecules: 4th International Conference on Laser Applications in Life Sciences - Jyvaskyla, Finland (Monday 7 September 1992)] Laser Study of Macroscopic Biosystems - Raman microspectroscopy and atomic force microscopy of chromosomal banding patterns

Puppels, Gerwin J., Putman, Constant A., de Grooth, Bart G., Greve, Jan, Korppi-Tommola, Jouko E.

Year:

1993

Language:

english

File:

PDF, 1.29 MB

english, 1993

3

A theoretical comparison between interferometric and optical beam deflection technique for the measurement of cantilever displacement in AFM

Constant A.J. Putman, Bart G. de Grooth, Niek F. van Hulst, Jan Greve

Journal:

Ultramicroscopy

Year:

1992

Language:

english

File:

PDF, 322 KB

english, 1992

4

Atomic force microscope featuring an integrated optical microscope

Constant A.J. Putman, Kees O. van der Werf, Bart G. de Grooth, Niek F. van Hulst, Frans B. Segerink, Jan Greve

Journal:

Ultramicroscopy

Year:

1992

Language:

english

File:

PDF, 756 KB

english, 1992

5

Immunogold labels: cell-surface markers in atomic force microscopy

Constant A.J. Putman, Bart G. de Grooth, Paul K. Hansma, Niek F. van Hulst, Jan Greve

Journal:

Ultramicroscopy

Year:

1993

Language:

english

File:

PDF, 611 KB

english, 1993

6

An atomic force microscopical study of the synaptonemal complex

Constant A.J. Putman, Axel J.J. Dietrich, Bart G. De Grooth, Jan Van Marle, Christa Heyting, Niek F. Van Hulst, Jan Greve

Journal:

Year:

1993

Language:

english

File:

PDF, 607 KB

english, 1993

7

Experimental observation of single-asperity friction at the atomic scale

Constant Putman, Reizo Kaneko

Journal:

Thin Solid Films

Year:

1996

Language:

english

File:

PDF, 572 KB

english, 1996

8

High-resolution imaging of chromosome-related structures by atomic force microscopy

Bart G. De Grooth, Constant A. J. Putman

Journal:

Journal of Microscopy

Year:

1992

Language:

english

File:

PDF, 790 KB

english, 1992

9

Tapping mode atomic force microscopy in liquid

Putman, Constant A. J., Van der Werf, Kees O., De Grooth, Bart G., Van Hulst, Niek F., Greve, Jan

Journal:

Applied Physics Letters

Year:

1994

Language:

english

File:

PDF, 727 KB

english, 1994

10

Vacuum chamber for sample attachment in atomic force microscopy

Putman, Constant A. J., van der Werf, Kees O., van Oort, Geeske, de Grooth, Bart G., van Hulst, Niek F., Greve, Jan

Journal:

Review of Scientific Instruments

Year:

1992

Language:

english

File:

PDF, 526 KB

english, 1992

11

Polymerized LB films imaged with a combined atomic force microscope-fluorescence microscope

Putman, Constant A. J., Hansma, Helen G., Gaub, Hermann E., Hansma, Paul K.

Journal:

Year:

1992

Language:

english

File:

PDF, 1.87 MB

english, 1992

12

Adhesion force imaging in air and liquid by adhesion mode atomic force microscopy

van der Werf, Kees O., Putman, Constant A. J., de Grooth, Bart G., Greve, Jan

Journal:

Applied Physics Letters

Year:

1994

Language:

english

File:

PDF, 773 KB

english, 1994

13

Atomic force microscope with integrated optical microscope for biological applications

Putman, Constant A. J., van der Werf, Kees O., de Grooth, Bart G., van Hulst, Niek F., Segerink, Frans B., Greve, Jan

Journal:

Review of Scientific Instruments

Year:

1992

Language:

english

File:

PDF, 944 KB

english, 1992

14

Compact stand-alone atomic force microscope

van der Werf, Kees. O., Putman, Constant A. J., de Grooth, Bart G., Segerink, Frans B., Schipper, Eric H., van Hulst, Niek F., Greve, Jan

Journal:

Review of Scientific Instruments

Year:

1993

Language:

english

File:

PDF, 1.17 MB

english, 1993

15

Single-asperity friction in friction force microscopy: The composite-tip model

Putman, Constant A. J., Igarashi, Masaru, Kaneko, Reizo

Journal:

Applied Physics Letters

Year:

1995

Language:

english

File:

PDF, 393 KB

english, 1995

16

SPIE Proceedings [SPIE OE/LASE '92 - Los Angeles, CA (Sunday 19 January 1992)] Scanning Probe Microscopies - Chromosome structure investigated with the atomic-force microscope

de Grooth, Bart G., Putman, Constant A., van der Werf, Kees O., van Hulst, Niko F., van Oort, Geeske, Greve, Jan, Manne, Srinivas

Year:

1992

Language:

english

File:

PDF, 272 KB

english, 1992

17

SPIE Proceedings [SPIE OE/LASE'93: Optics, Electro-Optics, & Laser Applications in Science& Engineering - Los Angeles, CA (Sunday 17 January 1993)] Scanning Probe Microscopies II - Stand-alone atomic force microscope featuring large, scan friction measurement, atomic resolution, and capability of liquid operation

Putman, Constant A., van der Werf, Kees O., de Grooth, Bart G., van Hulst, Niko F., Greve, Jan, Williams, Clayton C.

Year:

1993

Language:

english

File:

PDF, 985 KB

english, 1993

18

Tensile deformation behaviour of the polymer phase of flexible polyurethane foams and polyurethane elastomers

van Der Heide, Evert, van Asselen, Otto L.J., Ingenbleek, Gerwin W. H., Putman, Constant A. J.

Journal:

Macromolecular Symposia

Year:

1999

Language:

english

File:

PDF, 559 KB

english, 1999

19

SPIE Proceedings [SPIE OE/LASE '92 - Los Angeles, CA (Sunday 19 January 1992)] Scanning Probe Microscopies - New imaging mode in atomic-force microscopy based on the error signal

Putman, Constant A., van der Werf, Kees O., de Grooth, Bart G., van Hulst, Niko F., Greve, Jan, Hansma, Paul K., Manne, Srinivas

Year:

1992

Language:

english

File:

PDF, 691 KB

english, 1992